HOME > Article > DetailOxygen migration at Pt/HfO2/Pt interface under bias operationT. Nagata, M. Haemori, Y. Yamashita, H. Yoshikawa, Y. Iwashita, K. Kobayashi, T. Chikyow. Applied Physics Letters 97 [8] 082902. 2010.https://doi.org/10.1063/1.3483756 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at :2016-05-24 16:09:51 +0900 Updated at :2022-09-05 12:36:49 +0900