Secondary ion emission from Ar, Kr, Xe, N2, O2, CO, and SF6 adsorbed on Pt(111): Relation between neutralization of sputtered i | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

HOME > 論文 > 書誌詳細

Secondary ion emission from Ar, Kr, Xe, N2, O2, CO, and SF6 adsorbed on Pt(111): Relation between neutralization of sputtered i

The Journal of Chemical Physics 114 [4] 1823-1830. 2001.

https://doi.org/10.1063/1.1332790

NIMS著者

左右田龍太郎

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 11:42:31 +0900更新時刻: 2025-01-16 07:39:06 +0900

▲ページトップへ移動