Electronic structure ofFeSi1−xGexandFeGa3investigated by soft x-ray photoelectron spectroscopy complementary to x-ray emission spectroscopy

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Electronic structure ofFeSi1−xGexandFeGa3investigated by soft x-ray photoelectron spectroscopy complementary to x-ray emission spectroscopy
(Electronic structure ofFeSi1−xGexandFeGa3investigated by soft x-ray photoelectron spectroscopy complementary to x-ray emission spectroscopy)

H. Yamaoka, M. Matsunami, R. Eguchi, Y. Ishida, N. Tsujii, Y. Takahashi, Y. Senba, H. Ohashi, S. Shin.

Physical Review B 78 [4] 045125. 2008.

作成時刻: 2016-05-24 15:48:41 +0900 更新時刻: 2026-09-29 08:45:31 +0900