HOME > 論文 > 書誌詳細High-resolution transmission electron microscopy analysis of the interface between a Tl-1223 (001) superconducting film and an uBong-Jun Kim, Yoshio Matsui, Shigeo Horiuchi, Dae-Yeong Jeong, Christian Deinhofer, Gerhard Gritzner. Applied Physics Letters 85 [20] 4627-4629. 2004.https://doi.org/10.1063/1.1814804 NIMS著者松井 良夫Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 14:38:39 +0900更新時刻: 2024-05-02 04:45:42 +0900
