A low-temperature ultrahigh-vacuum scanning probe microscope with <i>in situ</i> electronic transport capabilities: From macro to nano in 10 minutes | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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A low-temperature ultrahigh-vacuum scanning probe microscope with in situ electronic transport capabilities: From macro to nano in 10 minutes

Diego Expósito, Oscar Custance, Iván Brihuega.

Review of Scientific Instruments 97 [9] 093701. 2026.

https://doi.org/10.1063/5.0336684

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MDRavailable A low-temperature ultrahigh-vacuum scanning probe microscope with <i>in situ</i> electronic transport capabilities: From macro to nano in 10 minutes

作成時刻: 2026-09-18 03:06:16 +0900 更新時刻: 2026-10-20 04:41:35 +0900

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