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Room temperature redox reaction by oxide ion migration at carbon/Gd-doped CeO2heterointerface probed by anin situhard x-ray photoemission and soft x-ray absorption spectroscopies

著者Takashi Tsuchiya, Shogo Miyoshi, Yoshiyuki Yamashita, Hideki Yoshikawa, Kazuya Terabe, Keisuke Kobayashi, Shu Yamaguchi.
掲載誌名Science and Technology of Advanced Materials 14 [4] 045001
ISSN: 18785514, 14686996
ESIでのカテゴリ: MATERIALS SCIENCE
出版社Informa UK Limited
発表年2013
言語English
DOIhttps://doi.org/10.1088/1468-6996/14/4/045001
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