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Sign reversal of the Hall resistivity in the electron-doped La2xCexCuO4 thin films
(電子ドープLa2xCexCuO4 薄膜におけるホール抵抗符号変化)

B.X. Wu, K. Jin, J. Yuan, H.B. Wang, T. Hatano, B. Xu, B.R. Zhao, B.Y. Zhu.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2018-06-08 21:29:55 +0900Updated at: 2024-05-02 09:31:44 +0900

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