HOME > Article > DetailQuantitative Photoelastic Characterization of Residual Strains in Grains of Multicrystalline SiliconMasayuki Fukuzawa, Masayoshi Yamada, Md. Rafiqul Islam, Jun Chen, Takashi Sekiguchi. Journal of Electronic Materials 39 [6] 700-703. 2010.https://doi.org/10.1007/s11664-010-1164-x NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:36:07 +0900Updated at: 2024-04-02 04:21:20 +0900
