HOME > Article > DetailElectrical Transport Properties Through Nanoscale and Large-Area Contacts of ZnO/Si DiodesMingsheng Xu, Daisuke Fujita, Peiliang Chen, Xiangyang Ma, Deren Yang. Current Nanoscience 6 [2] 219-225. 2010.https://doi.org/10.2174/157341310790945678 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:03:33 +0900 Updated at: 2026-10-08 07:35:23 +0900
