Electrically driven optical interferometry with spins in silicon carbide

Kevin C. Miao; Alexandre Bourassa; Christopher P. Anderson; Samuel J. Whiteley; Alexander L. Crook; Sam L. Bayliss; Gary Wolfowicz; Gergő Thiering; Péter Udvarhelyi; Viktor Ivády; Hiroshi Abe; Takeshi Ohshima; Ádám Gali; David D. Awschalom; Kevin C. Miao; Alexandre Bourassa; Christopher P. Anderson; Samuel J. Whiteley; Alexander L. Crook; Sam L. Bayliss; Gary Wolfowicz; Gergő Thiering; Péter Udvarhelyi; Viktor Ivády; Hiroshi Abe; Takeshi Ohshima; Ádám Gali; David D. Awschalom

doi:10.1126/sciadv.aay0527

Electrically driven optical interferometry with spins in silicon carbide

Kevin C. Miao, Alexandre Bourassa, Christopher P. Anderson, Samuel J. Whiteley, Alexander L. Crook, Sam L. Bayliss, Gary Wolfowicz, Gergő Thiering, Péter Udvarhelyi, Viktor Ivády, Hiroshi Abe, Takeshi Ohshima, Ádám Gali, David D. Awschalom.

Science Advances 5 [11] eaay0527. 2019.

https://doi.org/10.1126/sciadv.aay0527

Open Access American Association for the Advancement of Science (AAAS) (Publisher)

NIMS author(s)

UDVARHELYI, Peter

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2025-11-04 10:48:15 +0900 Updated at: 2026-10-15 04:35:27 +0900