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High-resolution transmission electron microscopy of planar defects in YBa2Cu4Oy doped with Ca

F.Izumi, K.Yanagisawa, Y.Yamada, T.Matsumoto, Y.Kodama, F.Izumi, K.Yanagisawa, Y.Yamada, T.Matsumoto, Y.Kodama.

physica C 533. 1991.

作成時刻: 2016-05-24 11:21:30 +0900更新時刻: 2018-12-15 00:49:00 +0900