HOME > 論文 > 書誌詳細Determination of In concentration in pseudomorphic InxGa1-xN quantum wells based on convergent-beam electron diffractionJ. N. Stirman, M. Takeguchi, M. R. McCartney, David J. Smith. Applied Physics Letters 84 [4] 490-492. 2004.https://doi.org/10.1063/1.1641173 NIMS著者竹口 雅樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 12:02:33 +0900更新時刻: 2024-03-29 20:59:18 +0900
