Commento on "High intensity low tube-voltage X-ray source for laboratory Extended X-ray Absorption Fine Structure measurements"
(「ラボラトリＥＸＡＦＳのための高強度ー低電圧ｘ線源」(Rev.Sci.Instrum.64,2702(1993)) へのコメント)
| Author(s) | 桜井健次, 桜井仁, Kenji Sakurai, Hitoshi Sakurai. |
|---|---|
| Journal title | Review of Scientific Instruments 65 [7] 2417-2418 |
| Publisher | |
| Year of publication | 1994 |
| Language | English |
| DOI | https://doi.org/10.1063/1.1144701 |
| Import this reference to Mendeley |  |