Commento on "High intensity low tube-voltage X-ray source for laboratory Extended X-ray Absorption Fine Structure measurements"
(「ラボラトリＥＸＡＦＳのための高強度ー低電圧ｘ線源」(Rev.Sci.Instrum.64,2702(1993)) へのコメント)
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Created at: 2017-03-13 20:33:38 +0900Updated at: 2024-04-01 23:21:53 +0900