Effects of Ti content on microstructure and shape memory behavior of TixNi(84.5−x)Cu15.5 (x=44.6–55.4) thin films | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Effects of Ti content on microstructure and shape memory behavior of TixNi(84.5−x)Cu15.5 (x=44.6–55.4) thin films
(TixNi(84.5-x)Cu15.5 (X=44.6-55.4) 薄膜の微細組織と形状記憶特性に及ぼすTi含有量の効果)

Akira Ishida, Morio Sato, Zhiyong Gao.

Acta Materialia 69 292-300. 2014.

https://doi.org/10.1016/j.actamat.2014.02.006

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作成時刻: 2016-05-24 17:18:22 +0900更新時刻: 2024-04-02 03:45:29 +0900

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