HOME > Article > DetailAnnular dark-field scanning confocal electron microscopy studied using multislice simulations(マルチスライスシミュレーションによる環状暗視野共焦点電子顕微鏡法の研究)HAMAOKA, Takumi, JAO, Chih-Yu, TAKEGUCHI, Masaki. MICROSCOPY (JOURNAL OF ELECTRON MICROSCOPY) 67 [4] 232-243. 2018.NIMS author(s)TAKEGUCHI, MasakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-03-04 09:36:45 +0900Updated at: 2019-05-10 18:54:58 +0900