HOME > 論文 > 書誌詳細Rapid measurement of low-order aberrations using Fourier transforms of crystalline RonchigramsKoji Kimoto, Kazuo Ishizuka. Ultramicroscopy 180 59-65. 2017.https://doi.org/10.1016/j.ultramic.2017.03.021 Open Access Elsevier BV (Publisher) Materials Data Repository (MDR) NIMS著者木本 浩司Materials Data Repository (MDR)上の本文・データセットMDRavailable Rapid measurement of low-order aberrations using Fourier transforms of crystalline Ronchigrams 作成時刻: 2017-10-11 20:58:05 +0900更新時刻: 2024-03-30 02:32:53 +0900
