Direct atomic scale imaging of grain boundaries and defects in Bi-2223/Ag high-Tc superconducting tapes
(Bi-2223/Ag超伝導テープ中の結晶粒界及び格子欠陥の高分解能Zコントラスト像観察)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-09-05 11:01:13 +0900 Updated at: 2022-09-05 11:01:13 +0900