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Contrast analysis of Shockley partial dislocations in 4H-SiC observed by synchrotron Berg–Barrett X-ray topography
(Contrast analysis of Shockley partial dislocations in 4H-SiC observed by synchrotron Berg–Barrett X-ray topography)

Hirofumi Matsuhata, Hirotaka Yamaguchi, Tamotsu Yamashita, Toshiaki Tanaka, Bin Chen, Takashi Sekiguchi.
Philosophical Magazine 94 [15] 1674-1685. 2014.
https://doi.org/10.1080/14786435.2014.894646

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