Nanoscale elemental identification by synchrotron-radiation-based scanning tunneling microscopy

Saito Akira; Takagi Yasutaka; Takahashi Koji; Hosokawa Hiromasa; Hanai Kazuhisa; Tanaka Takehiro; Akai-Kasaya Megumi; Tanaka Yoshihito; Shin Shik; Ishikawa Tetsuya; Kuwahara Yuji; AONO, Masakazu; Saito Akira; Takagi Yasutaka; Takahashi Koji; Hosokawa Hiromasa; Hanai Kazuhisa; Tanaka Takehiro; Akai-Kasaya Megumi; Tanaka Yoshihito; Shin Shik; Ishikawa Tetsuya; Kuwahara Yuji; AONO, Masakazu

Nanoscale elemental identification by synchrotron-radiation-based scanning tunneling microscopy

Saito Akira, Takagi Yasutaka, Takahashi Koji, Hosokawa Hiromasa, Hanai Kazuhisa, Tanaka Takehiro, Akai-Kasaya Megumi, Tanaka Yoshihito, Shin Shik, Ishikawa Tetsuya, Kuwahara Yuji, AONO, Masakazu.

SURFACE AND INTERFACE ANALYSIS 1033-1036. 2008.

NIMS author(s)

AONO, Masakazu

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-10-21 23:01:57 +0900 Updated at: 2022-10-21 23:01:57 +0900