Raman Scattering Characterization of Polytype in Silicon Carbide Ceramics: Comparison with X-ray Diffraction | SAMURAI, NIMS Researchers Directory Service

HOME > Article > Detail

Raman Scattering Characterization of Polytype in Silicon Carbide Ceramics: Comparison with X-ray Diffraction
(炭化ケイ素の多形のラマン散乱解析：X-線回折との比較)

Shin-ichi Nakashima, Makoto Higashihira, Kouji Maeda, Hidehiko Tanaka.

Journal of the American Ceramic Society 86 [5] 823-829. 2003.

https://doi.org/10.1111/j.1151-2916.2003.tb03382.x

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 11:57:05 +0900 Updated at: 2026-10-29 04:41:05 +0900

▲ Go to the top of this page