HOME > 論文 > 書誌詳細Structural characterization and iron detection at Σ3 grain boundaries in multicrystalline siliconBin Chen, Jun Chen, Takashi Sekiguchi, Mitsuhiro Saito, Koji Kimoto. Journal of Applied Physics 105 [11] 113502. 2009.https://doi.org/10.1063/1.3129583 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:05:31 +0900更新時刻: 2024-03-31 18:09:59 +0900
