HOME > 論文 > 書誌詳細High-resolution transmission electron microscopy of planer defects in Ca-doped YBCO/(1-2-4)high-Tc superconductors Y1-xCaxBa2Cu4F.Izumi, T.Matsumoto, Y.Kodama, S.Ikeda, K.Yanagisawa, S.Horiuchi, F.Izumi, T.Matsumoto, Y.Kodama, S.Ikeda, K.Yanagisawa, S.Horiuchi. J.Electron Microsc 40 221. 1991.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 11:21:42 +0900更新時刻: 2018-12-15 01:03:42 +0900
