HOME > 論文 > 書誌詳細High-Resolution Transmission Electron Microscope Study of Electron-Bean Induced Damage in Some Oxide Superconductors松井良夫, 柳澤佳寿美. Mat. Res. Soc. Symp. Proc. 635-646. 1992.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 10:34:46 +0900 更新時刻: 2022-09-05 10:34:46 +0900
