SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Influence of microscope settings on dislocation imaging in transmission forescattered electron imaging (t-FSEI)

Materials Characterization 203 113147. 2023.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2023-07-25 06:59:51 +0900 Updated at: 2026-10-08 08:46:36 +0900

    ▲ Go to the top of this page