HOME > Article > DetailInfluence of microscope settings on dislocation imaging in transmission forescattered electron imaging (t-FSEI)Ivan Gutierrez-Urrutia, Akinobu Shibata. Materials Characterization 203 113147. 2023.https://doi.org/10.1016/j.matchar.2023.113147 NIMS author(s)GUTIERREZ URRUTIA, IvanSHIBATA, AkinobuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2023-07-25 06:59:51 +0900 Updated at: 2026-10-08 08:46:36 +0900