The Local Structure of the BiS2 Layer in RE(O,F)BiS2 Determined by In-Plane Polarized X-ray Absorption Measurements

G. M. Pugliese; L. Tortora; E. Paris; T. Wakita; K. Terashima; A. Puri; M. Nagao; R. Higashinaka; T. D. Matsuda; Y. Aoki; T. Yokoya; T. Mizokawa; N. L. Saini; G. M. Pugliese; L. Tortora; E. Paris; T. Wakita; K. Terashima; A. Puri; M. Nagao; R. Higashinaka; T. D. Matsuda; Y. Aoki; T. Yokoya; T. Mizokawa; N. L. Saini

doi:10.3390/physchem1030019

The Local Structure of the BiS2 Layer in RE(O,F)BiS2 Determined by In-Plane Polarized X-ray Absorption Measurements

G. M. Pugliese, L. Tortora, E. Paris, T. Wakita, K. Terashima, A. Puri, M. Nagao, R. Higashinaka, T. D. Matsuda, Y. Aoki, T. Yokoya, T. Mizokawa, N. L. Saini.

Physchem 1 [3] 250-258. 2021.

https://doi.org/10.3390/physchem1030019

Open Access MDPI AG (Publisher)

NIMS author(s)

TERASHIMA, Kensei

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-12-17 03:24:47 +0900 Updated at: 2026-03-23 08:23:08 +0900