HOME > Article > DetailRelationship between diffraction peak, network topology, and amorphous-forming ability in silicon and silicaShinji Kohara, Motoki Shiga, Yohei Onodera, Hirokazu Masai, Akihiko Hirata, Motohiko Murakami, Tetsuya Morishita, Koji Kimura, Kouichi Hayashi. Scientific Reports 11 [1] 22180. 2021.https://doi.org/10.1038/s41598-021-00965-5 Open Access Springer Science and Business Media LLC (Publisher) NIMS author(s)ONODERA, YoheiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2021-11-18 03:37:04 +0900 Updated at: 2025-04-12 08:27:31 +0900