HOME > Article > DetailCrystalinity and thickness control of epitaxial ultra-thin Al2O3 film(極薄エピタキシャルアルミナ膜の結晶性と膜厚の制御)M Yoshitake, B Mebarki, T.T Lay. Surface Science 511 [1-3] L313-L318. 2002.https://doi.org/10.1016/s0039-6028(02)01567-4 NIMS author(s)YOSHITAKE, MichikoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:46:49 +0900 Updated at: 2026-08-01 05:48:44 +0900