HOME > 論文 > 書誌詳細Electrostatic force microscopy as a broadly applicable method for characterizing pyroelectric materialsCristina Martin-Olmos, Adam Z Stieg, James K Gimzewski. Nanotechnology 23 [23] 235701. 2012.https://doi.org/10.1088/0957-4484/23/23/235701 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:02:37 +0900 更新時刻: 2026-10-08 05:23:15 +0900
