HOME > 論文 > 書誌詳細Oxidation and reduction behavior of Ni and NiO layers sputter deposited onto yttrium-stabilized zirconia single crystalsYoon-Uk Heo, Masaki Takeguchi, Juanjuan Xing, Yoshiko Nakayama. Thin Solid Films 520 [1] 138-143. 2011.https://doi.org/10.1016/j.tsf.2011.06.109 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻 :2016-05-24 16:42:20 +0900 更新時刻 :2020-11-16 22:43:33 +0900