Oxidation and reduction behavior of Ni and NiO layers sputter deposited onto yttrium-stabilized zirconia single crystals | SAMURAI, NIMS Researchers Directory Service

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Oxidation and reduction behavior of Ni and NiO layers sputter deposited onto yttrium-stabilized zirconia single crystals

Yoon-Uk Heo, Masaki Takeguchi, Juanjuan Xing, Yoshiko Nakayama.

Thin Solid Films 520 [1] 138-143. 2011.

https://doi.org/10.1016/j.tsf.2011.06.109

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Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 16:42:20 +0900 Updated at: 2026-10-08 06:12:59 +0900

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