Surface resistance and field emission current measurements on chemically vapour deposited polycrystalline diamond measured by scanning probe methods | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Surface resistance and field emission current measurements on chemically vapour deposited polycrystalline diamond measured by scanning probe methods

Y Iseri, M Honda, Y-D Kim, T Ando, W Choi, H Tomokage.

Journal of Physics: Condensed Matter 16 [2] S171-S179. 2004.

https://doi.org/10.1088/0953-8984/16/2/020

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作成時刻: 2016-05-24 12:03:05 +0900 更新時刻: 2026-08-06 07:43:47 +0900

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