HOME > 論文 > 書誌詳細Local structure analysis of Sb, Bi, and Ag dopant atoms in Mg2Si semiconductor by x-ray absorption spectroscopy and first-principles calculationMamoru Kitaura, Shinta Wantanabe, Toshiaki Ina, Motoharu Imai, Haruhiko Udono, Manabu Ishizaki, Hisanori Yamane, Taku Tanimoto, Akimasa Ohnishi. Journal of Applied Physics 130 [24] 245105. 2021.https://doi.org/10.1063/5.0072589 NIMS著者今井 基晴Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-01-19 03:00:37 +0900更新時刻: 2024-03-31 16:15:22 +0900