HOME > 論文 > 書誌詳細Precise Damage Observation in Ion-Beam Etched MTJYuichi Ohsawa, Naoharu Shimomura, Tadaomi Daibou, Yuzo Kamiguchi, Satoshi Shirotori, Tomoaki Inokuchi, Daisuke Saida, Buyandalai Altansargai, Yushi Kato, Hiroaki Yoda, Tadakatsu Ohkubo, Kazuhiro Hono. IEEE Transactions on Magnetics 52 [7] 1-3. 2016.https://doi.org/10.1109/tmag.2015.2512588 NIMS著者大久保 忠勝宝野 和博Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-19 23:35:36 +0900更新時刻: 2024-04-01 23:31:07 +0900