Impacts of crystal orientation of GaAs on the interfacial structures and electrical properties of Hf0.6La0.4Ox films
(Impacts of crystal orientation of GaAs on the interfacial structures and electrical properties of Hf0.6La0.4Ox films)
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2016-05-24 17:22:28 +0900 更新時刻: 2026-10-30 07:36:05 +0900
