Comparison of bending strain effect on the critical current degradation of Bi-2223 Tapes through different measurement technique | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Comparison of bending strain effect on the critical current degradation of Bi-2223 Tapes through different measurement technique

Hyung-Seop Shin, H. Y. Choi, J. R. C. Dizon, 片桐一宗, KURODA, Tsuneo.

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS 741-745. 2006.

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作成時刻: 2022-10-21 22:15:12 +0900 更新時刻: 2022-10-21 22:15:12 +0900

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