HOME > Article > DetailX-ray analysis and mapping by wavelength dispersive X-ray spectroscopy in an electron microscopeTANAKA, Miyoko, TAKEGUCHI, Masaki, FURUYA, Kazuo. ULTRAMICROSCOPY 1427-1431. 2008.NIMS author(s)TANAKA, MiyokoTAKEGUCHI, MasakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-10-21 22:33:23 +0900 Updated at: 2022-10-21 22:33:23 +0900