High-Resolution Electron Microscopy on the Structure of Triple-Layer Defects Observed in Ca-Doped YBa2Cu4Oy | SAMURAI, NIMS Researchers Directory Service

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High-Resolution Electron Microscopy on the Structure of Triple-Layer Defects Observed in Ca-Doped YBa2Cu4Oy

松井良夫, 柳澤佳寿美.

Condensed Matter and Materials Communications 41. 1993.

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Created at: 2022-09-05 10:41:52 +0900 Updated at: 2022-09-05 10:41:52 +0900

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