HOME > Article > DetailElectrical and Optical Properties of Stacking Faults in 4H-SiC DevicesBin Chen, Jun Chen, Takashi Sekiguchi, Takasumi Ohyanagi, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura. Journal of Electronic Materials 39 [6] 684-687. 2010.https://doi.org/10.1007/s11664-010-1168-6 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:36:04 +0900 Updated at: 2026-09-29 07:29:46 +0900
