HOME > 論文 > 書誌詳細Electrical and Optical Properties of Stacking Faults in 4H-SiC DevicesBin Chen, Jun Chen, Takashi Sekiguchi, Takasumi Ohyanagi, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura. Journal of Electronic Materials 39 [6] 684-687. 2010.https://doi.org/10.1007/s11664-010-1168-6 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:36:04 +0900更新時刻: 2024-03-31 14:57:38 +0900
