HOME > Article > DetailContrast in atomically resolved EF-SCEM imagingPeng Wang, Adrian J. D’Alfonso, Ayako Hashimoto, Andrew J. Morgan, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo, Angus I. Kirkland, Leslie J. Allen, Peter D. Nellist. Ultramicroscopy 134 185-192. 2013.https://doi.org/10.1016/j.ultramic.2013.06.007 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 17:10:22 +0900Updated at: 2024-05-03 09:00:48 +0900