HOME > Article > DetailElectrical properties and stability of an epitaxial alumina film formed on Cu-9 at. % Al(111)Michiko Yoshitake, Takahiro Nagata, Weijie Song. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 30 [2] 021509. 2012.https://doi.org/10.1116/1.3688493 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:40:51 +0900 Updated at: 2026-10-30 08:00:08 +0900
