HOME > 論文 > 書誌詳細New method to characterize mesoscopic-range and very small strain with using multi-wave x-ray diffractionWataru Yashiro, Kazushi Sumitani, Toshio Takahashi, Yoshitaka Yoda, Kazushi Miki. Surface Science 550 [1-3] 93-105. 2004.https://doi.org/10.1016/j.susc.2003.12.025 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 11:55:55 +0900 更新時刻: 2025-06-16 05:20:23 +0900
