HOME > 論文 > 書誌詳細Direct acquisition of interferogram by stage scanning in electron interferometry(試料走査電子線ホログラフィー法の開発)Dan Lei, Kazutaka Mitsuishi, Ken Harada, Masayuki Shimojo, Dongying Ju, Masaki Takeguchi. Microscopy 62 [6] 563-570. 2013.https://doi.org/10.1093/jmicro/dft032 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:26:02 +0900更新時刻: 2024-04-02 02:46:39 +0900
