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In situ monitoring of stacking fault formation and its carrier lifetime mediation in p-type 4H-SiC
(In situ monitoring of stacking fault formation and its carrier lifetime mediation in p-type 4H-SiC)

Bin Chen, Jun Chen, Yuanzhao Yao, Takashi Sekiguchi, Hirofumi Matsuhata, Hajime Okumura.
Applied Physics Letters 105 [4] 042104. 2014.
https://doi.org/10.1063/1.4891834

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