HOME > 論文 > 書誌詳細Electron holographic study of the effect of contact resistance of connected nanowires on resistivity measurementTAKEGUCHI, Masaki, SHIMOJO, Masayuki, TANAKA, Miyoko, Renchao, CHE, Zhang, WEI, FURUYA, Kazuo. SURFACE AND INTERFACE ANALYSIS 1628-1631. 2006.NIMS著者竹口 雅樹田中 美代子Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-10-21 22:24:42 +0900 更新時刻: 2022-10-21 22:24:42 +0900
