HOME > Article > DetailElectron holographic study of the effect of contact resistance of connected nanowires on resistivity measurementTAKEGUCHI, Masaki, SHIMOJO, Masayuki, TANAKA, Miyoko, Renchao, CHE, Zhang, WEI, FURUYA, Kazuo. SURFACE AND INTERFACE ANALYSIS 1628-1631. 2006.NIMS author(s)TAKEGUCHI, MasakiTANAKA, MiyokoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-10-21 22:24:42 +0900 Updated at: 2022-10-21 22:24:42 +0900