Band alignment of InGaZnO4/Si interface by hard x-ray photoelectron spectroscopy
(Band alignment of InGaZnO4/Si interface by hard x-ray photoelectron spectroscopy)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 17:02:31 +0900 Updated at: 2026-10-30 07:32:38 +0900
