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Band alignment of InGaZnO4/Si interface by hard x-ray photoelectron spectroscopy
(Band alignment of InGaZnO4/Si interface by hard x-ray photoelectron spectroscopy)

Kyeongmi Lee, Kenji Nomura, Hiroshi Yanagi, Toshio Kamiya, Eiji Ikenaga, Takeharu Sugiyama, Keisuke Kobayashi, Hideo Hosono.
Journal of Applied Physics 112 [3] 033713. 2012.

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      Created at: 2016-05-24 17:02:31 +0900 Updated at: 2026-10-30 07:32:38 +0900

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