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Photo-capacitance spectroscopy investigation of deep-level defects in AlGaN/GaN hetero-structures with different current collapses

Yoshitaka Nakano, Yoshihiro Irokawa, Yasunobu Sumida, Shuichi Yagi, Hiroji Kawai.

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    Fulltext and dataset(s) on Materials Data Repository (MDR)


      Created at: 2016-05-24 16:11:54 +0900 Updated at: 2026-09-29 06:18:24 +0900

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