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Ellipsometry studies on a-C:H:N films to probe the possibility of application of these films as an anti-reflection coating
(無反射コーティング膜として利用する際のa-C:H:N膜の偏光解析法による光学特性評価)

Purayath Vinod.
DIAMOND AND RELATED MATERIALS . 2002.

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      Created at: 2022-09-05 11:12:03 +0900 Updated at: 2022-09-05 11:12:03 +0900

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