HOME > 論文 > 書誌詳細Cross-sectional X-ray microdiffraction study of a thick AlN film grown on a trench-patterned AlN/α-Al2O3 templateD.T. Khan, S. Takeuchi, J. Kikkawa, Y. Nakamura, H. Miyake, K. Hiramatsu, Y. Imai, S. Kimura, O. Sakata, A. Sakai. Journal of Crystal Growth 381 37-42. 2013.https://doi.org/10.1016/j.jcrysgro.2013.07.012 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:17:39 +0900更新時刻: 2024-04-02 04:24:05 +0900
