HOME > Article > DetailIn Situ Measurement of Al3+ Concentration Profile during Al Anodization using Digital Holographic Interferometric MicroscopeAkinori Miki, Kei Nishikawa, Takahiro Ozawa, Hisayoshi Matsushima, Mikito Ueda. Journal of The Electrochemical Society 167 [6] 062501. 2020.https://doi.org/10.1149/1945-7111/ab7bd6 Open Access The Electrochemical Society (Publisher) NIMS author(s)NISHIKAWA, KeiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-03-20 03:00:18 +0900 Updated at: 2026-09-29 05:18:20 +0900