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Analysis of Electron Channeling Contrast of Stacking Faults in fcc Materials

Ivan Gutierrez-Urrutia.

Microscopy and Microanalysis 27 [2] 318-325. 2021.

https://doi.org/10.1017/s1431927620024952

NIMS author(s)

GUTIERREZ URRUTIA, Ivan

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2021-09-18 03:00:19 +0900 Updated at: 2026-10-08 05:52:22 +0900

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