Humidity dependent structure of water at the interfaces between perfluorosulfonated ionomer thin film and Pt and HOPG studied by sum frequency generation spectroscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Humidity dependent structure of water at the interfaces between perfluorosulfonated ionomer thin film and Pt and HOPG studied by sum frequency generation spectroscopy
(SFG分光法によるPt/PFSIおよびHOPG/PFSI界面における湿度変化にともなう水の構造評価)

Hidenori Noguchi, Kento Taneda, Hideo Naohara, Kohei Uosaki.

Electrochemistry Communications 27 5-8. 2013.

https://doi.org/10.1016/j.elecom.2012.10.041

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作成時刻: 2016-05-24 16:50:32 +0900更新時刻: 2024-04-02 03:21:06 +0900

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